LCP-25 Experimental Ellipsometer

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Phau ntawv elliptical polarimeter siv cov txheej txheem extinction los ntsuas lub thickness thiab refractive index ntawm zaj duab xis, thiab manually tswj lub deviation thiab deviation lub kaum sab xis ntawm cov txheej txheem xeem.Ellipsometry yog dav siv nyob rau hauv kev ntsuas ntawm dielectric nyias zaj duab xis ntawm cov khoom substrate.Nyob rau hauv txoj kev ntsuas lub thickness ntawm cov zaj duab xis, nws yuav tsum tau ntsuas mus rau lub thinnest thiab lub siab tshaj precision.

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Product Detail

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Specifications

Kev piav qhia	Specifications
Thickness Measurement Range	1 nm ~ 300 nm
Ntau qhov xwm txheej Angle	30º ~ 90º, yuam kev ≤ 0.1º
Polarizer & Analyzer Intersection Angle	0º ~ 180º
Disk Angular Scale	2º rau scale
Min.Nyeem ntawv ntawm Vernier	0.05º Nws
Optical Center Qhov siab	1 52mm
Txoj kab uas hla ua haujlwm	Φ 50 hli
Zuag qhia tag nrho Dimensions	730 x 230 x 290 mm
Qhov hnyav	Kwv yees li 20 kg

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Kev piav qhia	Qty
Ellipsometer Unit	1
Nws-Ne Laser	1
Photoelectric Amplifier	1
Duab Cell	1
Silica Zaj duab xis ntawm Silicon Substrate	1
Kev Ntsuam Xyuas Software CD	1
Phau ntawv qhia	1